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Automated inspection microscope for 300 mm silicon substrates and tooling

Microscope d'inspection automatisé pour substrats de silicium 300 mm et outillage

Description

The National Research Council of Canada has a requirement for an automated optical microscope, dedicated to the inspection of microstructured silicon wafers up to 300 mm in diameter, either on their own or mounted in support custom tools. The key requirements for this system are a design with wide clearance on three sides, enabling large parts to be handled, and DIN EN ISO 14644-1 certification (ISO5 class cleanroom).

Quick Summary

The National Research Council Canada is seeking an automated optical microscope designed for inspecting microstructured silicon wafers up to 300 mm in diameter. The system must allow wide clearance on three sides for handling large parts and meet ISO5 class cleanroom certification standards.

Ideal For

Companies specializing in advanced optical inspection equipment for semiconductor manufacturing and cleanroom environments should consider bidding.

optical microscopessemiconductor inspectioncleanroom equipmentsilicon wafer inspectionautomated inspection systems
High complexity

Tender Details

Reference Number
cb-331-48984786
Solicitation Number
24-58321
Publication Date
Feb 25, 2025
Closing Date
Mar 12, 2025
Procurement Method
Advance contract award notice
Selection Criteria
Not applicable
Notice Type
Advance Contract Award Notice

Classification

UNSPSC Code
41110000
UNSPSC Description
Measuring and observing and testing instruments

Trade Agreements

Canada-Korea Free Trade Agreement (CKFTA); Canadian Free Trade Agreement (CFTA)

Contracting Entity

National Research Council Canada

1200 Montreal Road

Ottawa, Ontario

Contact

Veronica Exari

Veronica.Exari@nrc-cnrc.gc.ca

(343) 576-3252

Regions of Delivery

Canada